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Chemical/Material Characterization
- High
Performance Liquid Chromatography [HPLC]
- Gas
Liquid Chromatography [GLC]
- Fourier
Transform Infrared Spectrophotometer [FT-IR]
- Particle
Size Analyzer
- Moisture
Analysis by Karlfisher
- Elemental
Analysis by Inductive Coupled Plasma Spectrometer (ICP-MS)
- X-ray
Photoelectron Spectroscopy (XPS)
- Atomic
Absorption Spectrophotometer (AAS)
- Atomic
Force Microscopy (AFM)
- UV – Visible Spectroscopy (UV-Vis)
- Nuclear
Magnetic Resonance Spectroscopy (NMR)
- Single
Crystal X-ray analysis
- Powder
X-ray Diffraction (XRD)
- Thermal
Gravimetric Analysis (TGA, DTG) Analysis
- DSC
analysis
- Tensiometer
- Rheometer
- Field
Emission Scanning Electron Microscope (FE-SEM)
- Transmission
Electron Microscope (TEM)
- Spectroscopy:
Infra-Red spectroscopy (FTIR) with ATR, FTIR microscopy, Raman spectroscopy and
Raman microscopy, UV/Vis spectrometry, Nuclear Magnetic Resonance Spectroscopy
(NMR)
- Chromatography:
(GPC / HT- GPC, GC, GC-MS, GC/GC-MS HPLC, LC-MS)
- Thermal:
DMTA, DSC, TGA, DMA
- Elemental
Analysis – includes ICP-OES, ICP-MES, XPS, XRF and SEM-EDS, TEM, HRTEM
- C,
H, N, S, O Analysis
- Surface
Area Analysis by BET