Physics

Physical properties such as structural, magnetic, thermal and transport are measured to determine whether a material can be used for application or not. On customers’ request, we will help in data analysis of materials by our research experts.

X- Ray diffraction – to check the phase purity of materials.

TGA– (Thermogravimetric analysis) and DSC-(Differential scanning calorimetry) – For checking the thermal stability of materials under different gas environments.

Magnetometry: (SQUID-VSM , VSM)-for probing magnetic properties of materials.

Electron microscopy: (SEM, TEM)-To know the microstructure and elemental composition of materials.

Raman spectroscopy: for probing chemical composition of materials.

Physical property measurement system (PPMS) – can measure physical properties such as Electrical conductivity, Thermal conductivity, specific heat etc.

Ellipsometry –for measuring dielectric properties of thin films

AFM –Atomic force microscope –can measure young’s modulus and surface topology of materials

Dielectric Spectrometer-Impedance analyzer for dielectric studies of materials as a function of frequency.

X-ray photoelectron spectroscopy (XPS): to check elemental composition, chemical and electronic state of elements in materials.

Piezoelectric constant calibrator (d33): directly measures the piezoelectric constant d33 values of piezoelectric ceramics, polymers, and single crystals.

UV-VIS-NIR spectrophotometer: To understand the electronic transitions of molecules in solution as well as in the solid state.

X-ray fluorescence spectroscopy (XRF): to check the elemental composition of the samples.

Electron Spin Resonance Spectrometer (ESR): measurement of samples that contain unpaired electrons.

Nuclear Magnetic Resonance Spectroscopy (NMR): To know molecular structure of the system (sample).

A to Z

We will provide specific facilities based on your request. On customers’ request, we will help in data analysis of materials by our research experts.